DANEO 400 Received First Runner Up Award at ELECRAMA 2018 (India)

We are proud to announce that we have won the first runner up award for DANEO 400 at the ELECRAMA 2018 in India. The contest was awarded for the “Best product of an Indian or Overseas Exhibitor”, and DANEO 400 won rank 2.

ELECRAMA 2018, organized by the Indian Electrical & Electronic Manufacturers' Association (IEEMA), congregates global players and experts in the field of power generation, transmission, distribution and consumption, and we are very pleased to have significantly contributed with our IEC 61850 expertise at this event.

For more than 15 years, OMICRON has been providing testing tools for IEC 61850 communication. Starting with testing solutions making protection testing possible with GOOSE and Sampled Values (SV), we became the market leader for testing solutions for IEC 61850. With the development of DANEO 400, the hybrid signal analyzer for power utility automation systems, we enable our users to perform powerful measurements in digital substations, to comprehensively assess signals in IEC 61850 environments, and to keep track of what is going on in the substation by obtaining information on the operational status and communication.

 

“At ELECRAMA 2018, we realized that IEC 61850 has fully arrived in India. A wide range of projects – from station busses to process busses – were built using IEC 61850 and demonstrated at this huge event.”
(Mohit Kumar, Regional Application Specialist for Power Utility Communication)

Discover our Coverstories

Read Our Paper of the Month

June 7, 2021

Stator Core Condition Assessment with CPC 100

Sharing Knowledge - Paper of the Month

April 1, 2021

On-site Partial Discharge Measurement and Localization on a Power Transformer

Sharing Knowledge - Paper of the Month

March 3, 2021

Functional testing of IEC 61850 based Substation Automation Systems

Sharing Knowledge – Paper of the Month

Get in touch

Need more details? Get a quotation?
Request for a demo?


Contact us now
You are using an outdated browser version.
Please upgrade your browser or use another browser to view this page correctly.
×