Testing with Sampled Values
For protection testing utilizing Sampled Values, there are corresponding functions that wire CMC test sets to your station network. The test sets generate Sampled Values according to the “Implementation Guideline for Digital Interface to Instrument Transformers using IEC 61850-9-2“. The Sampled Values that have been published correspond to the analog voltages and currents that have been generated by the voltage and current outputs of the test set. Hybrid applications are also supported since the secondary values are still available.
Through this generic approach of applying the Sampled Values Configuration module, all the test modules in the powerful OMICRON Test Universe software can be used together with Sampled Values.