Investigation into a double-circuit line fault using the mutual coupling impedance Moritz Pikisch, OMICRON electronics Rainer Luxenburger, OMICRON electronics Abstract…
Soluciones de pruebas para sistemas de protección, automatización y control Catálogo de productos 2 La empresa OMICRON es una empresa internacional que surte al sector de…
1 Abstract—During the life cycle of a Substation Automation System (SAS), testing the communication, interlocking logic and proper operation of all signals transmitted to…
CMC 256plus Ordering Information Example order number Step 1: Hardware The CMC 256plus is the main hardware unit of your choice. Ordering instructions Step 2: Software…
CMC 356 Ordering Information Example order number Step 1: Hardware The CMC 356 is the main hardware unit of your choice. Ordering instructions Step 2: Software package…
Immerse yourself in your SAS During the commissioning of Substation Automation Systems (SAS) with Protection, Automation and Control (PAC), traditionally the focus of…
1 EnerLyzer Real-time measurement and signal recording for CMC 500 and CMC 430 Turn your CMC into a hybrid measurement and analysis tool The software tool EnerLyzer…
w The Importance of Demagnetizing the Transformer Core Sridhar Shenoy, OMICRON Energy Solution Private Limited, India Why is it important to demagnetize a transformer’s…
CMC 500 Ordering Information 2 CMC 500 Ordering information Do you need a specific configuration or just want an overview of the available options our CMC 500 offers?…
CMC 500 Ordering Information 2 CMC 500 Ordering information Do you need a specific configuration or just want an overview of the available options our CMC 500 offers?…
Functional Testing of IEC 61850 39 PAC.DECEMBER.2020 Te st in g Fu n ct io n al T es ti n g by Christian Brauner, OMICRON electronics GmbH, Austria and Eugenio…
thomas.renaudin@omicronenergy.com On-site non-intrusive testing of AC circuit-breakers T. RENAUDIN, A. NENNING OMICRON electronics Canada SUMMARY With their capability to…
1/12 Nuevas posibilidades para probar las funciones de localización de fallas con ondas viajeras en campo Autores: Christopher Pritchard, Heinz Lampl, Thomas Hensler,…